Probe Card |? Cantilever Probe Cards ?|? Logic Probe Card |??Vertical?Driver Probe Card |? Cantilever Probe Cards |??Vertical?Driver Probe Card |? Wafer Probe Card

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体育彩票17286开奖号码:R+ & U+ Solution for?High Speed Test

旺矽自行開發專有的R+和U+高速技術,兩者同時被廣泛應用在邏輯IC,記憶體IC和LCD驅動IC上。R +和U+這兩種高速技術穩定的被使用在工程或是量產上,且高速技術涵蓋的範圍已具有專利的保護

HSPC 特點:

  • Impedance matching probe structure
  • Available for the speed up to Gbps level